Compact model with physical parameter prediction capability for RF amplifiers

In this work presents an analysis of field effect transistors using pulsed voltage sources has been presented. Microwave measurements have been made in HEMT's and LDMOS technology devices highlighting the difference between the static and dynamic behavior of these devices. Based on measurements...

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Sonraí bibleagrafaíochta
Príomhchruthaitheoir: Rafael-Valdivia, Guillermo
Formáid: Online
Teanga:spa
Foilsithe / Cruthaithe: Universidad Pedagógica y Tecnológica de Colombia 2019
Ábhair:
Rochtain ar líne:https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9132

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