Compact model with physical parameter prediction capability for RF amplifiers
In this work presents an analysis of field effect transistors using pulsed voltage sources has been presented. Microwave measurements have been made in HEMT's and LDMOS technology devices highlighting the difference between the static and dynamic behavior of these devices. Based on measurements...
Príomhchruthaitheoir: | Rafael-Valdivia, Guillermo |
---|---|
Formáid: | Online |
Teanga: | spa |
Foilsithe / Cruthaithe: |
Universidad Pedagógica y Tecnológica de Colombia
2019
|
Ábhair: | |
Rochtain ar líne: | https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9132 |
Míreanna comhchosúla
- Míreanna comhchosúla
-
Improvements of the Design Process in the Microwave Transistors Industry
de réir: Rafael-Valdivia, Guillermo
Foilsithe / Cruthaithe: (2019) -
Closed equations for the design of class f amplifiers
de réir: Moreno-Rubio, Jorge Julián, et al.
Foilsithe / Cruthaithe: (2015) -
Design and implementation of a power amplifier rf at 1.748GHz- Area of engineering
de réir: Moreno-Rubio, Jorge Julián, et al.
Foilsithe / Cruthaithe: (2007) -
Waveform measurement in mocrowave device characterization: impact on power amplifiers design
de réir: Quaglia, Roberto, et al.
Foilsithe / Cruthaithe: (2016) -
GaN-based Power amplifiers for microwave applications
de réir: Moreno-Rubio, Jorge Julián, et al.
Foilsithe / Cruthaithe: (2017)