Compact model with physical parameter prediction capability for RF amplifiers

In this work presents an analysis of field effect transistors using pulsed voltage sources has been presented. Microwave measurements have been made in HEMT's and LDMOS technology devices highlighting the difference between the static and dynamic behavior of these devices. Based on measurements...

詳細記述

書誌詳細
第一著者: Rafael-Valdivia, Guillermo
フォーマット: Online
言語:spa
出版事項: Universidad Pedagógica y Tecnológica de Colombia 2019
主題:
オンライン・アクセス:https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9132

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