Improvements of the Design Process in the Microwave Transistors Industry
This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...
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| 格式: | Online |
| 语言: | spa |
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Universidad Pedagógica y Tecnológica de Colombia
2019
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| 主题: | |
| 在线阅读: | https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784 |
| _version_ | 1801706097342414848 |
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| author | Rafael-Valdivia, Guillermo |
| author_facet | Rafael-Valdivia, Guillermo |
| author_sort | Rafael-Valdivia, Guillermo |
| collection | OJS |
| description | This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding complex electromagnetic simulations of mutual coupling between the wires inside the transistor, which generally, in conventional CAD tools present a high computational cost. The electro-thermal model, enhanced by using the effective voltage approach, allowed us to predict not only the self-heating phenomena, but also the appropriate impedances for transistor´s maximum output power and maximum efficiency. In this way it was possible to select the operating conditions which can warrant low self-heating and the best trade-off between power, efficiency and linearity. The presented techniques are specifically important for the implementation of power amplifiers for the future wireless communication systems which must be designed to operate with broad band signals. The combination of our proposed techniques can allow the reduction of the design time and associated costs at industrial level. The improved design of experiment permitted to center the design of the transistor, making sure that the designer can get the best performances of the transistor. The thermal characterization allows to make sure that the microwave transistor operates below the maximum allowed temperature in a built power amplifier, which warrants the reliability of the system. |
| format | Online |
| id | oai:oai.revistas.uptc.edu.co:article-9784 |
| institution | Revista Facultad de Ingeniería |
| language | spa |
| publishDate | 2019 |
| publisher | Universidad Pedagógica y Tecnológica de Colombia |
| record_format | ojs |
| spelling | oai:oai.revistas.uptc.edu.co:article-97842021-07-13T02:25:45Z Improvements of the Design Process in the Microwave Transistors Industry Mejoras del proceso de diseño en la industria de transistores de microondas Rafael-Valdivia, Guillermo circuits microwave power semiconductors radio communication transistors circuitos microondas radiocomunicación semiconductores de potencia transistores This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding complex electromagnetic simulations of mutual coupling between the wires inside the transistor, which generally, in conventional CAD tools present a high computational cost. The electro-thermal model, enhanced by using the effective voltage approach, allowed us to predict not only the self-heating phenomena, but also the appropriate impedances for transistor´s maximum output power and maximum efficiency. In this way it was possible to select the operating conditions which can warrant low self-heating and the best trade-off between power, efficiency and linearity. The presented techniques are specifically important for the implementation of power amplifiers for the future wireless communication systems which must be designed to operate with broad band signals. The combination of our proposed techniques can allow the reduction of the design time and associated costs at industrial level. The improved design of experiment permitted to center the design of the transistor, making sure that the designer can get the best performances of the transistor. The thermal characterization allows to make sure that the microwave transistor operates below the maximum allowed temperature in a built power amplifier, which warrants the reliability of the system. Este artículo presenta una técnica para mejorar el proceso de diseño industrial de transistores de microondas, basado en un diseño de experimentos mejorado (DOE) y un modelado electrotérmico (MET) expandido. El diseño de experimentos DOE permitió centrar el diseño a través de variaciones en parámetros específicos, para evitar complejas simulaciones electromagnéticas de acoplamiento mutuo entre los cables dentro del mismo transistor, que generalmente en herramientas CAD convencionales presentan un elevado costo computacional. El modelo electrotérmico mejorado utilizando la técnica de voltajes efectivos posibilitó predecir no solo el autocalentamiento, sino también las impedancias apropiadas para la máxima potencia de salida y la máxima eficiencia del transistor. De esta manera fue posible elegir las condiciones de operación que garantizaran un reducido autocalentamiento, así como las mejores condiciones de potencia, eficiencia y linealidad. Las técnicas presentadas son útiles para la implementación de amplificadores de potencia en los futuros sistemas de comunicación inalámbricos, ya que deben trabajar con potencias elevadas que producen autocalentamiento y con señales de gran ancho de banda. La combinación de ambas técnicas permite la reducción de diseño y tiempo de producción en el ámbito industrial. El diseño de experimento mejorado posibilitó centrar el diseño del transistor para asegurar la obtención de los mejores desempeños del transistor. La caracterización térmica facilitó que el transistor de microondas, implementado en un circuito impreso de potencia, funcionara por debajo de la temperatura máxima permitida, lo que garantiza su vida útil y, en consecuencia, la confiabilidad del sistema de transmisión completo. Universidad Pedagógica y Tecnológica de Colombia 2019-06-25 info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion review revisión application/pdf application/xml https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784 10.19053/01211129.v28.n52.2019.9784 Revista Facultad de Ingeniería; Vol. 28 No. 52 (2019); 99-122 Revista Facultad de Ingeniería; Vol. 28 Núm. 52 (2019); 99-122 2357-5328 0121-1129 spa https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784/8136 https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784/8251 N.A. N.A. |
| spellingShingle | circuits microwave power semiconductors radio communication transistors circuitos microondas radiocomunicación semiconductores de potencia transistores Rafael-Valdivia, Guillermo Improvements of the Design Process in the Microwave Transistors Industry |
| title | Improvements of the Design Process in the Microwave Transistors Industry |
| title_alt | Mejoras del proceso de diseño en la industria de transistores de microondas |
| title_full | Improvements of the Design Process in the Microwave Transistors Industry |
| title_fullStr | Improvements of the Design Process in the Microwave Transistors Industry |
| title_full_unstemmed | Improvements of the Design Process in the Microwave Transistors Industry |
| title_short | Improvements of the Design Process in the Microwave Transistors Industry |
| title_sort | improvements of the design process in the microwave transistors industry |
| topic | circuits microwave power semiconductors radio communication transistors circuitos microondas radiocomunicación semiconductores de potencia transistores |
| topic_facet | circuits microwave power semiconductors radio communication transistors circuitos microondas radiocomunicación semiconductores de potencia transistores |
| url | https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784 |
| work_keys_str_mv | AT rafaelvaldiviaguillermo improvementsofthedesignprocessinthemicrowavetransistorsindustry AT rafaelvaldiviaguillermo mejorasdelprocesodedisenoenlaindustriadetransistoresdemicroondas |
