Improvements of the Design Process in the Microwave Transistors Industry

This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...

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Bibliographic Details
Main Author: Rafael-Valdivia, Guillermo
Format: Online
Language:spa
Published: Universidad Pedagógica y Tecnológica de Colombia 2019
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Online Access:https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784
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