Improvements of the Design Process in the Microwave Transistors Industry

This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...

Täydet tiedot

Bibliografiset tiedot
Päätekijä: Rafael-Valdivia, Guillermo
Aineistotyyppi: Online
Kieli:spa
Julkaistu: Universidad Pedagógica y Tecnológica de Colombia 2019
Aiheet:
Linkit:https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784

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