Improvements of the Design Process in the Microwave Transistors Industry
This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...
第一著者: | Rafael-Valdivia, Guillermo |
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フォーマット: | Online |
言語: | spa |
出版事項: |
Universidad Pedagógica y Tecnológica de Colombia
2019
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主題: | |
オンライン・アクセス: | https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784 |
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