Improvements of the Design Process in the Microwave Transistors Industry

This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...

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מידע ביבליוגרפי

מחבר ראשי:	Rafael-Valdivia, Guillermo
פורמט:	Online
שפה:	spa
יצא לאור:	Universidad Pedagógica y Tecnológica de Colombia 2019
נושאים:	circuits microwave power semiconductors radio communication transistors circuitos microondas radiocomunicación semiconductores de potencia transistores
גישה מקוונת:	https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784