Improvements of the Design Process in the Microwave Transistors Industry

This paper presents a technique to improve the design process of microwave transistors based on two aspects: an improved design of experiment test (DOE), and an electro-thermal enhanced model (MET). The DOE test allowed us to center the design through variations in specific parameters, avoiding comp...

詳細記述

書誌詳細
第一著者: Rafael-Valdivia, Guillermo
フォーマット: Online
言語:spa
出版事項: Universidad Pedagógica y Tecnológica de Colombia 2019
主題:
オンライン・アクセス:https://revistas.uptc.edu.co/index.php/ingenieria/article/view/9784